Karl Ludwig
· ProfessorBoston University · Physics
Active 1852–2025
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About
Karl Ludwig is a Professor in the Department of Physics at Boston University. His research focuses on real-time x-ray studies of materials processes, investigating how materials evolve on atomic and nano-length scales during growth, patterning, or electrochemical functions using real-time x-ray techniques. He utilizes high-brightness synchrotron x-ray sources such as the National Synchrotron Light Source II at Brookhaven National Laboratory and the Advanced Photon Source at Argonne National Laboratory. Ludwig has been particularly active in advancing the application of coherent x-ray scattering techniques, including X-ray Photon Correlation Spectroscopy (XPCS), and makes efforts to connect experimental results with fundamental theory and simulation. His recent research directions include understanding surface and thin film processes, studying the relationship between atomic structure and function in solid oxide fuel cell cathodes, and examining the structure of molten salts relevant for energy applications. Ludwig holds a Ph.D. in Applied Physics from Stanford University, earned in 1986, and a B.A. in Physics from Cornell University, graduated magna cum laude in 1980. His academic background and extensive research contributions establish him as a leading figure in the field of experimental condensed matter physics and materials science.
Research topics
- Optics
- Quantum mechanics
- Physics
- Optoelectronics
- Chemistry
- Statistical physics
- Chemical physics
- Nanotechnology
- Materials science
- Condensed matter physics
Selected publications
Physical Review Letters · 2021 · 11 citations
Investigating the relationship between structure and dynamical processes is a central goal in condensed matter physics. Perhaps the most noted relationship between the two is the phenomenon of de Gennes narrowing, in which relaxation times in liquids are proportional to the scattering structure factor. Here, a similar relationship is discovered during the self-organized ion-beam nanopatterning of silicon using coherent x-ray scattering. However, in contrast to the exponential relaxation of fluct…
Physical review. B./Physical review. B · 2021 · 7 citations
X-ray photon correlation spectroscopy (XPCS) is used to investigate the fluctuation dynamics during self-organized nanopatterning of silicon by ${\mathrm{Ar}}^{+}$ bombardment at ${65}^{\ensuremath{\circ}}$ polar angle. Rich structure is observed in the development of the correlation dynamics as seen in the evolving correlation time $\ensuremath{\tau}({q}_{||})$ and fluctuation relaxation exponent $n({q}_{||})$. On length scales of the ripple structure, local structure becomes ever more long liv…
Physical review. B./Physical review. B · 2021-05-20 · 7 citations
articleOpen accessUnderstanding the self-organized ion beam nanopatterning of elemental semiconductors, particularly silicon, is of intrinsic scientific and technological interest. This is the second component of a two-part coherent x-ray scattering and x-ray photon correlation spectroscopy (XPCS) investigation of the kinetics and fluctuation dynamics of nanoscale ripple development on silicon during 1 keV ${\mathrm{Ar}}^{+}$ (part I) and ${\mathrm{Kr}}^{+}$ bombardment at ${65}^{\ensuremath{\circ}}$ polar angle.…
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2022-10-04 · 5 citations
articlePlasma-enhanced atomic layer deposition (PEALD) enables the epitaxial growth of ultrathin indium nitride (InN) films at significantly reduced process temperatures and with greater control of layer thickness compared to other growth methods. However, the reliance on plasma-surface interactions increases the complexity of the growth process. A detailed understanding of the relationship between the plasma properties and the growth kinetics is therefore required to guide the tuning of growth paramet…
Physical review. B./Physical review. B · 2021-12-27 · 5 citations
articleOpen accessThe ion-induced nanoscale pattern formation on a crystalline Ge(001) surface is observed in situ by means of grazing incidence small angle x-ray scattering (GISAXS). Analysis of the GISAXS intensity maps yields the temporal development of geometric parameters characterizing the changing pattern morphology. In comparison with theoretical predictions and with simulations of the patterning process based on a continuum equation we find good agreement for the temporal evolution of the polar facet ang…
Recent grants
Surface Nanopatterning by Ion Bombardment
NSF · $338k · 2013–2017
Real-time X-ray Studies of Surface Evolution During Ion Bombardment and Plasma Processing
NSF · $330k · 2005–2009
NSF · $315k · 2022–2025
Frequent coauthors
- 78 shared
J. Woodward
United States Naval Research Laboratory
- 76 shared
Charles R. Eddy
Office of Naval Research
- 75 shared
Scooter D. Johnson
Boston University
- 75 shared
Neeraj Nepal
United States Naval Research Laboratory
- 74 shared
Zachary R. Robinson
- 71 shared
Samantha G. Rosenberg
Sandia National Laboratories
- 61 shared
Christa Wagenbach
Boston University
- 54 shared
Alexander C. Kozen
University of Maryland, College Park
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